Scanning Electron Microscopy (SEM) Lab Services
The Scanning Electron Microscope (SEM) is a highly effective and versatile tool for investigating textures and structures that are difficult or impossible to see with the optical microscope. The SEM uses electrons, which have a much shorter wavelength than visible light. Consequently, surfaces can be examined at much greater magnification, resolving power and depth of field. The SEM at IPS is capable of resolving features as small as several hundreds of nanometers in size and at magnifications up to 60,000 times. In addition, with its superior depth of focus and contrast, the SEM also is capable of illustrating textures and shapes in the magnification range of the low power dissecting microscope of 10X to 100X.
The SEM capabilities at IPS are ideal for identifying inorganic contaminants, inclusions, surface textures, fracture surfaces, structural and compositional characteristics of prepared cross sections. Combined with our
Image Analysis capabilities, textures and structures also can be quantified.
Let us help you with your SEM imaging needs!
Contact our Fiber Science lab with questions that may require analysis by SEM. 920-749-3040 ext. 121.
Energy Dispersive X-Ray Spectrometry
Energy Dispersive X-ray (EDX) in the electron microscope
The electron microscope utilizes high energy electrons rather than visible light. Among the interactions that occur between the electrons and the sample material is an emission of x-rays from the atoms that compose the material. The benefit to the microscopist is that the emitted x-rays have specific energy levels that are unique to the elements from which they were emitted. The energy dispersive x-ray spectrometer attached to the Scanning Electron Microscope (SEM) counts the x-rays and classifies them according to energy level to produce a plot showing quantities of x-rays versus energy level, referred to as an energy spectrum. The peaks in the spectrum are characteristic of the elements within the sample.
The majority of known elements from carbon to uranium and beyond are detectable. Consequently, the elemental composition of any inorganic material can be characterized by this method. Since the spectrometer “counts” x-rays, the relative amounts of each element can also be determined.
Compositional Mapping with EDX Spectrometry
Not only can specific elements be detected based on their characteristic x-rays, but their locations can also be determined with great accuracy. As the electron beam “scans” over an area of interest, the EDX spectrometer not only counts and measures the x-rays, it also records the location from which selected x-ray energies emanated. The result is a map of selected elements. Such maps can be applied to a wide variety of applications from problem solving and contaminant identification to fundamental research.
Microscopy Services
IPS staff has a world-wide reputation for testing pulped wood based products. It also has microscopy, image analysis and chemistry professionals who are capable of providing a multi-disciplinary approach to a wide array of materials and manufacturing problems using:
Papers (coated, uncoated, filled and treated)
Wood pulp based tissues