Scanning Electron Microscope (SEM) Lab Services
IPS hosts a Jeol Scanning Electron Microscope (SEM) that is the ultimate tool for providing detailed images of paper and fiber products to clients located in the United States and North America, to international corporations. The SEM test can probe deeply into complex structures with an unprecedented depth-of-field and clarity to provide images with magnifications ranging from 25X to 20,000X!
Our SEM Lab has a state-of-the-art Image Capture System that allows us rapidly to save, retrieve and send you mega-pixel photos electronically without the expense and time-delay of hard copy photographs.
The Energy-Dispersive Spectroscopy (EDS) accessory allows elemental identification for determining typically what type and relatively how much metal is present in a sample. The Back-Scatter Detector (BSE) provides advanced compositional and topological imaging modes to accent surface structure or phase contrast by distinguishing regions of different atomic weights.
IPS' SEM Laboratory Provides:
- - High-resolution digital photography and images up to 25,000X magnification
- - Back-scatter electron detection for compositional and topological imaging
- - Energy dispersive spectroscopy (EDS) and elemental identification amounts
For many applications, our SEM laboratory provides superior photographs when situations require magnifications, high resolution, intense surface structure, high depth-of-field or when differential atomic composition are involved.
Beyond all this, the crystal-clear, high-resolution images are suitable for quantitative work as an input for Automatic Image Analysis.
Contact our Fiber Science lab directly with questions about SEM testing at 920-749-3040 ext. 127.